1. 在hard-switching 或 soft-switching下執行動態分析(Dynamics under hard switching or soft switching)
➢ Trapping induced Rdson increasing during switching
➢ Hard switching worse than Soft switching (ZVS)
➢ Switching Voltage dependent 2. Gate 操作電壓0-12V連續變化,可以隨著不同DUT Gate Rating做適當調整(Switching On-Vg : 1V~12V for device benchmark) 3. 在hard-switching 或 soft-switching下執行動態Vth分析(Dynamic Vth under hard switching or soft switching)