The LTE/LTE-Advanced FDD measurement application is one in a common library of more than 25 measurement applications in the Keysight X-Series, an evolutionary approach to signal analysis that spans instrumentation, measurements and software. Transforming the X-Series signal analyzers into standard-based transmitter testers, the application provides RF conformance measurements to help you design, evaluate, and manufacture your LTE and LTE-Advanced FDD base station and user equipment devices. The measurement application closely follows the 3GPP standard allowing you to stay on the leading edge of your design and manufacturing challenges.
For LTE-Advanced demodulation measurements, such as EVM and frequency error, the measurement application uses an automatic sequencing function, instead of a single wideband capture of the multi-carrier signal, eliminating the need for the wide analysis bandwidth option on the X-Series signal analyzer and thereby reducing the overall test equipment cost.
LTE/LTE-Advanced FDD Measurement Application for CXA
Currently listed/Now supported